Measurement System Analysis (MSA) as a dynamic, rather than static, beastie is discussed in a new online article entitled:Dynamic Analysis Offers a Better MSA Management Alternative on Semiconductor International, A Reed publication, by author Phillip H. Williams from Freescale Semiconductor.

Among its answers to the question: “How often must we repeat our measurement system analysis?”, is Dynamic MSA and, “..the key to performing a dynamic MSA is to have SPC properly implemented for the subject measurement system. In practice, this should be done regardless of MSA intent — to guarantee the stability of the measurement system.”

We think it is well worth a read.

Enjoy!

TEMPERATURES.COM, INC. publishes information about measurement devices and measurement on its websites. The sites have articles, directories and news to foster competent measurements & analysis in industry & science. Sites are free. Submissions by visitors are encouraged and reviewed. Sites as of August 2007 are: lehos tecHeadlines, measureNEWS, About Temperature Sensors, TempSensor Directories, TempSensorNEWS, Measurement Databases, (MeasurementBlog.com)MeasurementMedia.com and MeasurementDevices.com